HAST (Highly Accelerated Stress Test) reduces the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks.
Any product or material testing process that requires humidity testing may benefit from switching to HAST.
During the environmental stress screening and life testing a considerable length of time can be consumed do
to lengthy testing protocols. As a result innovative techniques including, highly accelerated life test (HALT), highly
accelerated stress screening (HASS) or highly accelerated stress test (HAST) have been introduced with good results.
Common HAST Testing Methods
- JEDEC Standard No.22-110B: Highly Accelerated Temperature and Humidity Stress Test
- JEDEC Standard No.22-118: Accelerated Moisture Resistance - Unbiased HAST
- IEC Publication 60068-2-66 (1994-6): Damp Heat Steady State
- IEC Publication 60749 Amendment 1: Damp Heat, Steady State Highly Accelerated
- EIAJ ED-4701 Method B-123: Unsaturated Vapor Pressure Test
Cascade TEK's HAST Testing Services Deliver:
 |
Reduced Cycle Time |
|
Data Logging Capabilities |
|
Automatic Operation Cycles |
|
Power Cycling Capabilities |
Our Environmental Stress Screening and Product Life Testing Services Comply with Industry Standards and Protocols.
|
